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Keynote Photonics Develops DLP Controller Solution for 3D Metrology and Industrial Photonics

Keynote Photonics has revealed the FlexLight X3 DLP Controller Solution, developed for photonics applications and machine vision systems.

Available in multiple configurations for automated optical inspection, industrial DLP and machine vision systems, the FlexLight X3 platform features a 2GB dual camera frame capture functionality that coordinates with a user-programmable pattern generating system.

The X3 machine vision platform features Texas Instruments’ DLP5500 XGA chipset and a DMD chip. The X3 features a real-time frame capture system, a graphics processor a DLP projection module. Backwards compatible with the DLP Light Commander software, the X3 supports LED, hybrid and lamp illumination systems. It is available integrated with a standard projector or as a standalone module.

The President of Keynote Photonics, Adam Kunzman stated that the FlexLight X3 is a groundbreaking solution that uses DLP technology for 3D metrology and machine vision applications. Kunzman also highlighted its advantages by adding that the small size, flexibility, high functional integration of the FlexLight X3 solution makes it ideal for DLP-based machine vision and photonics applications.

At the 2012 Photonics West conference being held at the Moscone Center in San Francisco between 21 and 26 January, Keynote will showcasethe prototype of a 300 lumen LED projector best suited for 3D metrology.

The Texas-based Keynote Photonics develops custom and standard DLP solutions and development tools for lithography, machine vision, biometrics, spectroscopy and 3D scanning,applications.

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